ASD Technical Report, Numéro 62,Partie 323Aeronautical Systems Division, Air Force Systems Command, United States Air Force, 1963 |
Table des matières
THEORETICAL BACKGROUND | 5 |
TENSILE EXPERIMENTS | 21 |
XRAY DIFFRACTION MEASUREMENTS OF MICROSTRAIN | 54 |
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Expressions et termes fréquents
Aeronautical Systems Division anelastic behavior anelastic lattice strains anelastic strain Appendix applied stress Aval fr OTS based on dislocation-interstitial bcc metals behavior of bcc BEHAVIOR OF TANTALUM cal/mole Cottrell atmospheres covery delay process indicate Dir/Materials and Processes dislocation dislocation segments dislocation-interstitial interaction effective activation energies elastic ELECTRON BEAM MELTED Equation Figure FRICTION IN RECRYSTALLIZED gage high temperature study hydrogen inches indicate that hydrogen internal friction interstitial diffusion interstitial impurities ap interstitials contributing ity in tantalum jump frequency lattice constant lattice deformation load application martensitic mechanism microcreep microstrain rate molybdenum number of dislocations observed orientation of interstitial Poisson's ratio Pomona pre-yield micro preferred positions range from 97°F RECRYSTALLIZED COLUMBIUM RECRYSTALLIZED TANTALUM reorientation slip plane specimen stitial strain rate strains during load substantiated by x-ray tantalum and columbium temperature range terstitial dif theoretical model thermocouples Wright-Patterson AFB x-ray diffraction yield delay experiments yield delay process yield point yield stress